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Continuous Improvement

The purpose of the Continuous Improvement Process (CIP) is to increase outcomes for all students and close performance gap(s) using multiple cycles of inquiry. The heart of this problem-solving approach is problem articulation and root-cause analysis to purposefully slow down the natural tendency towards solution generation or solutionitis. A commitment to engage in adaptive and often difficult problem analysis, from multiple perspectives, can help unearth assumptions and position leaders to be more intentional and resourceful.

KCSOS Continuous Improvement Process (CIP) Institute — The KCSOS CIP model is delivered over the course of one year and organized into three basic areas: a) Focusing Direction, b) Action Planning, and c) Implementation and Monitoring.

Continuous Improvement Resources – Resources and tools to assist LEAs and schools as they plan and implement their continuous improvement efforts.

LEA Self-Assessment – A tool for District leadership teams to examine the current status of systemic practices that have been consistently demonstrated through research to be the components of effective district systems.

LEA Self-Assessment Abridged version – The Abridged LEA Self-Assessment can be used by District Leadership Teams to narrow focus and select one or two system components to be reviewed and discussed with greater detail via the LEA Self-Assessment.

SWIFT Fidelity Integrity Assessment (SWIFT-FIA) – A tool for School Leadership Teams to examine the current implementation status of schoolwide practices that have been demonstrated through research to provide a basis for successfully including all students who live in the school community.

SWIFT Guide – Resources for implementing each practice.

  • The SWIFT Guide includes the following for each practice:
    • SWIFT-in-60- An overview that explains what the feature is all about
    • In-Depth Section- Resources for digging deeper into each practice
    • Resources- Tools and resources that can be used to understand or implement each feature